Offset Creation¶
Quickly create new features using Offset from the right-click menu in the tree view.
Note
- The offset creation method is applicable to creating point, circle, sphere, and slot features.
- Using the offset creation method requires existing point, circle, sphere, and slot features.
- Features created using the offset method are reference features.
Creation Steps¶
- Right-click on the point, circle, sphere, or slot features in the left tree view and select Offset.
- In the offset pop-up window, enter the offset values on the X, Y, and Z axes.
- Click Confirm to create the corresponding new feature based on the offset values.
Note
Features created using the offset method are reference features. If measured features are needed, you can manually extract the measured features.
Extract Measured Values¶
After creating reference features, the corresponding measured features can be extracted automatically or manually.
Note
Import at least one measured model before extracting measured features to generate feature pairs.
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Automatic Extraction: Enable Auto Extraction of Measured Values via
Settings in the upper right corner of the software interface or check
Extract Measured Feature in the creation window. The software will automatically extract the corresponding measured feature with default parameters after creating any reference feature.Note
If there are multiple measurement objects, please select the corresponding extraction object in the creation window; the default selection is the first measured model or the first measured model within the first measurement group.
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Manual Extraction: After creating a reference feature, right-click the feature group in the tree view on the left, select Extract Measured Feature and specify the measurement model to be extracted; you can specify Align Object in the extraction pop-up window.
Note
When selecting sub-features, 2D features, or when there are only sub-features or 2D features in multiple selections or groups, right-click the feature group in the left tree view and select Extract Measured Feature to directly extract the measured feature without selecting a measured model.